support@dynardo.de, Tel.: +49 (0) 3643 9008-32
Concept
Finite element structure
Any structure possesses some natural randomness due to material scatter or manufacturing tolerance. Engineers need to evaluate statistical data on structures in order to locate 'hot spots' of variation and investigate the cause of scatter by statistical means. For this purpose, Dynardo developed Statistics on Structure, SoS, which reads structure (node, element) - related results of computations with randomly simulated input. Based on these data, statistical measures are determined and visualized directly on the FE structure.
Visualization
Post processing window
Visualization of the statistical data is based on an interactive multi-window concept. Numerous possibilities are available for evaluation and documentation, and exporting of data for further analysis.
GUI
A guided step by step procedure enables an easy set up of the application.
Statistics
The following statistical measures can be plotted on the FE structure.
- Descriptive statistics (like means, standard deviations or quantiles)
- Single designs and design difference
- Eroded elements
- Quality capability statistics
- Input / output correlation and coefficient of determination
Benefits
By introducing SoS in the development process, you may:
- locate 'hot spots' of high scatter directly on the structure,
- analyse the most relevant components, i.e. shapes of imperfection,
- evaluate the influence of imperfections on the structure's performance,
- reveal the statistical dependency of imperfections to scattering input.
Interfaces
The reference structure and structure-related output data can be imported from several common FE programs. Special formats can be implemented on request. Samples of input data may be read from the optiSLang data structure or as text file. For further analysis within optiSLang, samples of output data at selected nodes or elements and imperfection amplitudes are exported as optiSLang result file.
Publications
Bayer, V.; Roos, D. (Dynardo GmbH): Non-parametric Structural Reliability Analysis using Random Fields and Robustness Evaluation; Proceedings Optimization and Stochastic Days 3.0, 2006, Weimar, Germany
Bayer, V.; Roos, D. (Dynardo GmbH); Einzinger, J. (ANSYS): Random Fields: Theory and Applications; Proceedings Optimization and Stochastic Days 6.0, 2009, Weimar, Germany
Distributors
SoS is sold worldwide. A list of our distributors can be found here.
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